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Search for "SiGe nanocrystals in SiO2/SiGe/SiO2 multilayers" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Fabrication and characterization of Si₁₋_xGe_x nanocrystals in as-grown and annealed structures: a comparative study

Muhammad Taha Sultan,
Adrian Valentin Maraloiu,
Ionel Stavarache,
Jón Tómas Gudmundsson,
Andrei Manolescu,
Valentin Serban Teodorescu,
Magdalena Lidia Ciurea and
Halldór Gudfinnur Svavarsson

Beilstein J. Nanotechnol. 2019, 10, 1873–1882, doi:10.3762/bjnano.10.182

Graphical Abstract

consequential interface characteristics and its effect on the photocurrent spectra. Keywords: grazing incidence XRD (GIXRD); high-power impulse magnetron sputtering (HiPIMS); HRTEM; magnetron sputtering; photocurrent spectra; SiGe nanocrystals in SiO2/SiGe/SiO2 multilayers; STEM-HAADF; TEM; Introduction

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Published 17 Sep 2019

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